TimeDomain CVD, Inc.

Plasmas and Deposition

Virtues...

 

Consider a typical capacitive plasma. The electron temperature might be 3 eV; the ion and neutral temperatures are much smaller. As shown in the table below, the number of electrons with sufficient energy to dissociate a molecule is 10 to 100 times larger than the number that can ionize; the plasma will produce a large supply of excited and dissociated molecules and thus reactive radicals, even for a modest fractional ionization.

substance

dissociation energy (eV)

ionization energy (eV)

n(diss)/n(ion) @ Te = 3 eV

H2

4.5

15.4

38

O2

5.2

12

9.6

CH4

4.5

12.6

15

F2

1.6

15.7

109

The first reason to employ a plasma in deposition is thus to crack relatively stable molecules and encourage deposition at much lower temperatures and pressures than would be required for thermal CVD.

film

precursors

thermal deposition

plasma-enhanced

silicon nitride

SiH4 or SiH2Cl2 and NH3

750 C

200-500 C

silicon dioxide

SiH4 and O2

350-550 C

200-400 C

TEOS and O2

700-900 C

300-500 C

amorphous silicon

SiH4

550-650 C

200-400 C

TEOS = tetraethyl orthosilicate, Si(OC2H5)4

The second reason to use plasma deposition is more subtle but of great importance. Recall that surfaces exposed to a capacitive plasma are subject to bombardment by energetic ions, whose kinetic energy can vary from a few eV to 100's of electron volts. Ion bombardment of this nature has very significant effects on the properties of the deposited film. Increasing ion bombardment tends to make films denser and cause the film stress to become more compressive.

It is often the case than dielectric films which are porous and under tensile stress cause reliability problems in IC fabrication. Plasma-enhanced deposition techniques can deposit dense films at temperatures hundreds of degrees less than required for thermal densification. However, excessive compressive stress can also lead to impaired reliability. The ability to adjust stress, through changes in process conditions, chamber geometry, or excitation (dual frequency mixtures) is of considerable importance in successful semiconductor processing.

A final important benefit of plasma deposition is the ability to easily clean the reactor. For example, by introducing a fluorine-containing gas (e.g. CF4) and igniting a plasma, one can clean silicon, silicon nitride, or (with rather more difficulty) silicon dioxide from the electrodes and chamber walls. Chamber cleaning is of great practical importance; thick films built up on the parts of a chamber may "spall" (break off), creating particles which can fall onto the substrates and cause defects in circuit patterns, reducing the yield of good circuits from the process.

 

...and Vices...

 

The bombardment of surfaces with ions also leads to sputtering: the displacement of atoms from the surface into the gas phase by incoming ions. The displaced ions diffuse through the gas and can land anywhere in the chamber, including on the substrates. Sputtering can be an important source of trace metallic contamination in PECVD films.

Sputtering of substrate material can be intentionally exploited to improve the conformality and gap filling ability of deposited films: this is typically done using high-density plasma reactors, and will be discussed in more detailed in the section on reactor designs.

Ion bombardment is different on horizontal and vertical surfaces; thus, the composition and density of films can depend on the topography.

Plasma deposition of metallic or other highly conductive films is challenging: the deposited film tends to short out the powered electrode of a capacitive plasma reactor, or coat the dielectric window of an inductive reactor, shielding the chamber from the magnetic field.

 

The plasma generation apparatus adds considerably to the complexity and cost of reactors, and complicates operation. The plasma requires one or more power supplies, each with an appropriate matching network, and electrically insulating but mechanically sound materials for isolating powered electrodes. Substrate heaters must be electrically isolated from the plasma. Choice of materials is influenced by the possibility of contamination.

 

 

 

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